Using atom probe tomography to understand ZnO:Al/SiO2/Si Schottky diodes, R. Jaramillo, A. Youseff, A. Akey, F. Schoofs. S. Ramanathan and T. Buonassisi, Physical Review Applied, 6, 034016 (2016)
https://shriram-ramanathan.org/wp-content/uploads/2022/09/Rutgers_1-300x105.jpg00Shriram Ramanathanhttps://shriram-ramanathan.org/wp-content/uploads/2022/09/Rutgers_1-300x105.jpgShriram Ramanathan2016-12-20 12:52:572020-08-01 17:51:08Using atom probe tomography to understand ZnO:Al/SiO2/Si Schottky diodes, R. Jaramillo, A. Youseff, A. Akey, F. Schoofs. S. Ramanathan and T. Buonassisi, Physical Review Applied, 6, 034016 (2016)
